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Calibration Substrates

for probe tip calibration – available in 9 standard models

Our accurate, easy to use calibration substrates, calibration coefficients, and detailed instructions allow you to correct the measurement system (network analyzer + cabling + probe) whenever it produces a reading different than the standard. The typical elements for calibrating a microwave measurement system consists of opens, shorts, matched loads, and throughs. These four elements have electrical characteristics that are very different from one another so that each element contributes an important part to the overall calibration process. In principle any set of standards could be employed, however, the more identical the standards are, the less accurate the calibration process becomes, which in turn results in inaccurate the on-wafer testing. Our precision crafted calibration substrates, when properly used, assure you of accurate on-wafer test results.

Overview

The GGB Industries, Inc., line of CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe® at the probe tip.

The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected.

The GGB Industries, Inc., line of calibration substrates is such a standard. Each calibration substrate contains highly precise elements for calibrating out the unavoidable errors and losses in a microwave network analyzer, its associated cabling, and the microwave probe to ensure accurate on-wafer testing.

Features

Supports Precise SOLT, LRL/TRL, and LRM/TRM calibrations
Includes CalKit software for easy loading to Network Analyzer
Wide pitch range from 30 to 2,540 microns
Suitable for all Picoprobes® from DC to 220 GHz
Available for GS, SG, GSG Footprints
Convenient alignment structures
Individually tested and trimmed to exacting standards

Downloads

How to select the correct calibration substrate for your probing application(s):

Identify your Picoprobe’s footprint and pitch (tip spacing);
Determine which calibration type is appropriate for your application (SOLT, LRL/TRL, or LRM/TRM)*;
Using the Calibration Substrate Selection Guide, choose the calibration substrate which matches your Picoprobe’s footprint, recommended pitch range, and your preferred calibration type.

Calibration Substrate Selection Guide

Calibration Substrate	Pad Size (microns)	Calibration Types Supported	Footprint	Pitch Range Recommended (microns)	Pitch Range Acceptable (microns)	PDF
CS-105	50 X 50	SOLT, LRL, LRM	GSG	75 - 250	75 -250	CS-105 Map and Key
CS-109	100 X 100	SOLT, LRL, LRM	GSG	250 - 600	150 - 600	CS-109 Map and Key
CS-10	150 X 150	SOLT, LRM	GSG	600 - 1250	225 - 1250	CS-10 Map and Key
CS-18	300 X 300	SOLT, LRM	GSG	1250 - 2540	500 - 2540	CS-18 Map and Key

CS-108	50 X 50 100 X 100 150 X 150	SOLT, LRM	GS, SG	50 - 200	50 -300	CS-108 Map and Key
CS-114	100 X 100	SOLT, LRM	GS, SG	200 - 400	150 - 600	CS-114 Map and Key
CS-111	150 X 150	SOLT, LRM	GS, SG	400 - 1250	175 - 1250	CS-111 Map and Key
CS-17	300 X 300	SOLT, LRM	GS, SG	750 - 2540	450 - 2540	CS-17 Map and Key

Special Calibration Substrate Designed For Use Above 110 GHz

Calibration Substrate	Pad Size (microns)	Calibration Types Supported	Footprint	Pitch Range Recommended (microns)	Pitch Range Acceptable (microns)	PDF
CS-115	25 X 25	SOLT, LRL, LRM	GSG	40 - 150 (SOLT) 30 - 150 (LRL)	40 - 150	CS-115 Map and Key

SOLT = Short-Open-Load-Through
LRL = Line-Reflect-Line (Which is equivalent to TRL = Through-Reflect-Line)
LRM = Line-Reflect-Match (Which is equivalent to TRM = Through-Reflect-Match)

Differential Calibration Substrate Selection Guide GSGSG

Calibration Substrate	Pad Size (microns)	Calibration Types Supported	Footprint	Recommended Pitch (microns)	Acceptable Pitch (microns)	PDF
CS-2-50	25 X 25	SOLT, LRL, LRM	GSGSG	50	45-55	CS-2-50 Map
CS-2-75	25 X 25	SOLT, LRL, LRM	GSGSG	75	70-80
CS-102-100	50 X 50	SOLT, LRL, LRM	GSGSG	100	90 - 110	CS-102-100 Map and Key
CS-102-125	50 X 50	SOLT, LRL, LRM	GSGSG	125	115 - 135	CS-102-125 Map and Key
CS-2-150	50 X 50	SOLT, LRL, LRM	GSGSG	150	140 -160	CS-2-150 Map and Key
CS-2-200	50 X 50	SOLT, LRL, LRM	GSGSG	200	190 - 210	CS-2-XXX Map and Key
CS-2-225	50 X 50	SOLT, LRL, LRM	GSGSG	225	215 - 235	CS-2-XXX Map and Key
CS-102-250	50 X 50	SOLT, LRL, LRM	GSGSG	250	240 -260	CS-102-250 Map and Key
CS-2-300	100 X 100	SOLT, LRL, LRM	GSGSG	300	275 - 325	CS-2-300 Differential Calibration Substrate Map
CS-2-350	100 X 100	SOLT, LRL, LRM	GSGSG	350	325 - 375	CS-2-350 Map
CS-2-400	100 X 100	SOLT, LRL, LRM	GSGSG	400	375 - 425	CS-2-400 Map
CS-2-450	100 X 100	SOLT, LRL, LRM	GSGSG	450	425 - 475	CS-2-450 Map
CS-2-500	100 X 100	SOLT, LRL, LRM	GSGSG	500	490 - 510	CS-2-500 map
CS-102-650	150 X 150	SOLT, LRL, LRM	GSGSG	650	625-675
CS-2-750	150 X 150	SOLT, LRL, LRM	GSGSG	750	700 - 800	CS-2-750 Map
CS-2-1000	150 X 150	SOLT, LRL, LRM	GSGSG	1000	990 - 1010	CS-2-1000 Map
CS-2-1250	150 X 150	SOLT, LRL, LRM	GSGSG	1250	1225 - 1275

GSSG

Calibration Substrate	Pad Size (microns)	Calibration Types Supported	Footprint	Recommended Pitch (microns)	Acceptable Pitch (microns)	PDF
CS-103-50	25 X 25	SOLT, LRM	GSSG	50	45-60	CS-103-50 Map and Key
CS-103-75	25 X 25	SOLT, LRM	GSSG	75	65-85	CS-103-75 Map and Key
CS-103-100	50 X 50	SOLT, LRM	GSSG	100	85 - 115	CS-103-100 Map and Key
CS-103-125	50 X 50	SOLT, LRM	GSSG	125	110 - 140	CS-103-125 Map and Key
CS-103-150	50 X 50	SOLT, LRM	GSSG	150	135 -165	CS-103-150 Map and Key
CS-3-175	50 X 50	SOLT, LRM	GSSG	175	160 - 190	CS-3-XXX Map and Key
CS-103-200	50 X 50	SOLT, LRM	GSSG	200	185 - 215	CS-103-200 Map and Key
CS-3-250	100X 100	SOLT, LRM	GSSG	250	200 - 300	CS-3-XXX Map and Key
CS-103-350	100 X 100	SOLT, LRM	GSSG	350	300 - 400	CS-103-350 Map and Key
CS-3-450	100 X 100	SOLT, LRM	GSSG	450	400 - 500	CS-3-450 Map and Key
CS-103-500	150 X 150	SOLT, LRM	GSSG	500	425 - 525	CS-103-500 Map and Key
CS-3-600	100 X 100	SOLT, LRM	GSSG	600	550 - 625	CS-3-600 Map and Key
CS-103-800	300 X 300	SOLT, LRM	GSSG	800	600 - 1000	CS-103-800 Map
CS-103-1000	300 X 300	SOLT, LRM	GSSG	1000	800 - 1075	CS-103-1000 Map and Key
CS-3-1250	300 X 300	SOLT, LRM	GSSG	1250	1050 - 1325	CS-3-1250 Map and Key

SGS

Calibration Substrate	Pad Size (microns)	Calibration Types Supported	Footprint	Recommended Pitch (microns)	Acceptable Pitch (microns)	PDF
CS-4-100	50 X 50	SOLT, LRM	SGS	100	90 - 110	CS-4-100 Map
CS-4-150	50 X 50	SOLT, LRM	SGS	150	140 - 160	CS-4-150 Map and Key
CS-4-250	100 X 100	SOLT, LRM	SGS	250	225 - 275	CS-4-250 Map and Key
CS-4-300	100 X 100	SOLT, LRM	SGS	300	275 - 325	CS-4-XXX Map and Key
CS-4-350	100 X 100	SOLT, LRM	SGS	350	325 - 375	CS-4-XXX Map and Key

Calibration Substrates

How to select the correct calibration substrate for your probing application(s):

Calibration Substrate Selection Guide

Special Calibration Substrate Designed For Use Above 110 GHz

Differential Calibration Substrate Selection Guide GSGSG

GSSG

SGS

High Frequency Mixed Mode

Differential Calibration Substrates

Unibody

Dual/Differential Microwave Probe

Model 145A

Model 110H

Ultra Low Loss Probes

Model 67A

GGB Industries

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