Differential Calibration Substrates

for two, three or four port probe tip calibrations

Our accurate, easy to use calibration substrates, calibration coefficients, and detailed instructions allow you to precisely calibrate the measurement system to the probe tips.

The typical elements for calibrating a microwave measurement system consists of opens, shorts, 50 ohm loads, and throughs. Our precision crafted calibration substrates, when properly used, assure you of accurate on-wafer test results.

All load standards are individually inspected and trimmed to within 0.25% accuracy using NIST traceable equipment.

Easy to use step by step instructions are provided for use with Agilent ENA four port network analyzers and Agilent PNA network analyzers with PLTS software.

Overview

The GGB Industries, Inc., line of DIFFERENTIAL CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe® at the probe tip.

The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected. The GGB Industries, Inc., line of calibration substrates is such a standard.

Each calibration substrate contains highly precise elements for calibrating out the unavoidable errors and losses in a microwave network analyzer, its associated cabling, and the microwave probe to ensure accurate on-wafer testing.

  • Supports Precise SOLT, LRL and LRM calibrations
  • Includes CalKit software for easy loading to Network Analyzer
  • Pitch range from 45 to 1325 microns
  • Suitable for all Picoprobes® from DC to 110 GHz
  • Available for GSGSG , GSSG, and SGS Footprints
  • Load standards individually trimmed to 0.25% accuracy
  • 25 mil (635 micron) thick alumina substrate
Calibration Substrate PDF
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Differential Calibration Substrate Selection Guide

Calibration SubstratePad Size (microns)Calibration Types SupportedFootprintRecommended Pitch (microns)Acceptable Pitch (microns)PDF
CS-2-5025 X 25SOLT, LRL, LRMGSGSG5045-55CS-2-50 Map
CS-2-7525 X 25SOLT, LRL, LRMGSGSG7570-80
CS-102-10050 X 50SOLT, LRL, LRMGSGSG10090 - 110CS-102-100 Map and Key
CS-102-12550 X 50SOLT, LRL, LRMGSGSG125115 - 135CS-102-125 Map and Key
CS-2-15050 X 50SOLT, LRL, LRMGSGSG150140 -160CS-2-150 Map and Key
CS-2-20050 X 50SOLT, LRL, LRMGSGSG200190 - 210CS-2-XXX Map and Key
CS-2-22550 X 50SOLT, LRL, LRMGSGSG225215 - 235CS-2-XXX Map and Key
CS-102-25050 X 50SOLT, LRL, LRMGSGSG250240 -260CS-102-250 Map and Key
CS-2-300100 X 100SOLT, LRL, LRMGSGSG300275 - 325CS-2-300 Differential Calibration Substrate Map
CS-2-350100 X 100SOLT, LRL, LRMGSGSG350325 - 375CS-2-350 Map
CS-2-400100 X 100SOLT, LRL, LRMGSGSG400375 - 425CS-2-400 Map
CS-2-450100 X 100SOLT, LRL, LRMGSGSG450425 - 475CS-2-450 Map
CS-2-500100 X 100SOLT, LRL, LRMGSGSG500490 - 510CS-2-500 map
CS-102-650150 X 150SOLT, LRL, LRMGSGSG650625-675
CS-2-750150 X 150SOLT, LRL, LRMGSGSG750700 - 800CS-2-750 Map
CS-2-1000150 X 150SOLT, LRL, LRMGSGSG1000990 - 1010CS-2-1000 Map
CS-2-1250150 X 150SOLT, LRL, LRMGSGSG12501225 - 1275
Calibration SubstratePad Size (microns)Calibration Types SupportedFootprintRecommended Pitch (microns)Acceptable Pitch (microns)PDF
CS-103-5025 X 25SOLT, LRMGSSG5045-60CS-103-50 Map and Key
CS-103-7525 X 25SOLT, LRMGSSG7565-85CS-103-75 Map and Key
CS-103-10050 X 50SOLT, LRMGSSG10085 - 115CS-103-100 Map and Key
CS-103-12550 X 50SOLT, LRMGSSG125110 - 140CS-103-125 Map and Key
CS-103-15050 X 50SOLT, LRMGSSG150135 -165CS-103-150 Map and Key
CS-3-17550 X 50SOLT, LRMGSSG175160 - 190CS-3-XXX Map and Key
CS-103-20050 X 50SOLT, LRMGSSG200185 - 215CS-103-200 Map and Key
CS-3-250100X 100SOLT, LRMGSSG250200 - 300CS-3-XXX Map and Key
CS-103-350100 X 100SOLT, LRMGSSG350300 - 400CS-103-350 Map and Key
CS-3-450100 X 100SOLT, LRMGSSG450400 - 500CS-3-450 Map and Key
CS-103-500150 X 150SOLT, LRMGSSG500425 - 525CS-103-500 Map and Key
CS-3-600100 X 100SOLT, LRMGSSG600550 - 625CS-3-600 Map and Key
CS-103-800300 X 300SOLT, LRMGSSG800600 - 1000CS-103-800 Map
CS-103-1000300 X 300SOLT, LRMGSSG1000800 - 1075CS-103-1000 Map and Key
CS-3-1250300 X 300SOLT, LRMGSSG12501050 - 1325CS-3-1250 Map and Key
Calibration SubstratePad Size (microns)Calibration Types SupportedFootprintRecommended Pitch (microns)Acceptable Pitch (microns)PDF
CS-103-50-H20 X 20SOLT, LRMGSSG5045 - 55
CS-103-75-H25 X 25SOLT, LRMGSSG7565 - 85
CS-103-100-H40 X 40SOLT, LRMGSSG10085 - 115CS-103-100-H Map
CS-103-125-H50 X 50SOLT, LRMGSSG125110 - 140CS-103-125-H map
CS-103-150-H50 X 50SOLT, LRMGSSG150135 -165CS-103-150-H map
CS-103-175-H50 X 50SOLT, LRMGSSG175160 - 190CS-103-175-H Map
CS-103-200-H50 X 50SOLT, LRMGSSG200185 - 215CS-103-200-H Map
CS-103-225-H50 X 50SOLT, LRMGSSG225210 - 240
CS-103-250-H50 X 50SOLT, LRMGSSG250235 - 265CS-103-250-H Map
CS-103-350-H100 X 100SOLT, LRMGSSG350300 - 400
CS-103-500-H100 X 100SOLT, LRMGSSG500400 - 500
CS-103-650-H100 X 100SOLT, LRMGSSG650550 - 750
Calibration SubstratePad Size (microns)Calibration Types SupportedFootprintRecommended Pitch (microns)Acceptable Pitch (microns)PDF
CS-4-10050 X 50SOLT, LRMSGS10090 - 110CS-4-100 Map
CS-4-15050 X 50SOLT, LRMSGS150140 - 160CS-4-150 Map and Key
CS-4-250100 X 100SOLT, LRMSGS250225 - 275CS-4-250 Map and Key
CS-4-300100 X 100SOLT, LRMSGS300275 - 325CS-4-XXX Map and Key
CS-4-350100 X 100SOLT, LRMSGS350325 - 375CS-4-XXX Map and Key

SOLT = Short-Open-Load-Through
LRL = Line-Reflect-Line
LRM = Line-Reflect-Match

Standard Calibration Substrate Selection Guide

Calibration SubstratePad Size (microns)Calibration Types SupportedFootprintPitch Range Recommended (microns)Pitch Range Acceptable (microns)PDF
CS-10550 X 50SOLT, LRL, LRMGSG75 - 25075 -250CS-105 Map and Key
CS-109100 X 100SOLT, LRL, LRMGSG250 - 600150 - 600CS-109 Map and Key
CS-10150 X 150SOLT, LRMGSG600 - 1250225 - 1250CS-10 Map and Key
CS-18300 X 300SOLT, LRMGSG1250 - 2540500 - 2540CS-18 Map and Key
CS-10850 X 50
100 X 100
150 X 150		SOLT, LRMGS, SG50 - 20050 -300CS-108 Map and Key
CS-114100 X 100SOLT, LRMGS, SG200 - 400150 - 600CS-114 Map and Key
CS-111150 X 150SOLT, LRMGS, SG400 - 1250175 - 1250CS-111 Map and Key
CS-17300 X 300SOLT, LRMGS, SG750 - 2540450 - 2540CS-17 Map and Key

Special Calibration Substrate Designed For Use Above 110 GHz

Calibration SubstratePad Size (microns)Calibration Types SupportedFootprintPitch Range Recommended (microns)Pitch Range Acceptable (microns)PDF
CS-11525 X 25SOLT, LRL, LRMGSG40 - 150 (SOLT)
30 - 150 (LRL)		40 - 150CS-115 Map and Key

SOLT = Short-Open-Load-Through
LRL = Line-Reflect-Line (Which is equivalent to TRL = Through-Reflect-Line)
LRM = Line-Reflect-Match (Which is equivalent to TRM = Through-Reflect-Match)

High Frequency Mixed Mode

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Calibration Substrates

for probe tip calibration – available in 9 standard models

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Unibody

Mixed Mode GSSG

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Dual/Differential Microwave Probe

two microwave probes on one positioner – 40A, 50A, 67A, or 110H

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Model 145A

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Model 110H

dc to 110 GHz/1.0 mm connector input

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Ultra Low Loss Probes

Models available up to 11GHz

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Model 67A

dc to 67 GHz/1.85 mm V connector input

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GGB Industries

GGB Industries Inc. serves the on-wafer probing needs of the worldwide semiconductor industry, based in Naples Florida.

PHONE

(239) 643-4400

EMAIL

email@ggb.com

MAILING ADDRESS

GGB Industries, Inc.
4196 Corporate Sq
Naples, FL 34104

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