Our accurate, easy to use calibration substrates, calibration coefficients, and detailed instructions allow you to correct the measurement system (network analyzer + cabling + probe) whenever it produces a reading different than the standard. The typical elements for calibrating a microwave measurement system consists of opens, shorts, matched loads, and throughs. These four elements have electrical characteristics that are very different from one another so that each element contributes an important part to the overall calibration process. In principle any set of standards could be employed, however, the more identical the standards are, the less accurate the calibration process becomes, which in turn results in inaccurate the on-wafer testing. Our precision crafted calibration substrates, when properly used, assure you of accurate on-wafer test results.

How to select the correct calibration substrate for your probing application(s):

1) Identify your Picoprobe’s footprint and pitch (tip spacing);
2) Determine which calibration type is appropriate for your application (SOLT, LRL/TRL, or LRM/TRM)*;
3) Using the Calibration Substrate Selection Guide, choose the calibration substrate which matches your Picoprobe’s footprint, recommended pitch range, and your preferred calibration type.

SOLT = Short-Open-Load-Through
LRL = Line-Reflect-Line (Which is equivalent to TRL = Through-Reflect-Line)
LRM = Line-Reflect-Match (Which is equivalent to TRM = Through-Reflect-Match)